Correlated double sampling
In today's world, Correlated double sampling represents a topic of great relevance and interest to a wide spectrum of the population. Since its emergence, Correlated double sampling has captured the attention of academics, experts, professionals and the general public due to its impact on various aspects of society. With a scope that transcends geographical and cultural borders, Correlated double sampling has become a point of convergence for the exchange of opinions, knowledge and points of view. In this article, we will explore in detail the different aspects related to Correlated double sampling, analyzing its importance, its evolution over time and its influence in the present. At the same time, we will examine the future implications of Correlated double sampling in a constantly changing world.
Correlated double sampling (CDS[1]) is a method to measure electrical values such as voltages or currents that allows removing an undesired offset. It is often used when measuring sensor outputs. The output of the sensor is measured twice: once in a known condition and once in an unknown condition. The value measured from the known condition is then subtracted from the unknown condition to generate a value with a known relation to the physical quantity being measured.
This is commonly used in switched-capacitor operational amplifiers to effectively double the gain of the charge sharing opamp, while adding an extra phase.
When used in imagers, correlated double sampling is a noise reduction technique in which the reference voltage of the pixel (i.e., the pixel’s voltage after it is reset) is subtracted from the signal voltage of the pixel (i.e., the pixel’s voltage at the end of integration) at the end of each integration period, to cancel kTC noise (the thermal noise associated with the sensor's capacitance).
See also
References
- ^ Donati (2000). Photodetectors: Devices, Circuits and Applications. NJ: Prentice-Hall. ISBN 0130203378.
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